JPH0437390B2 - - Google Patents

Info

Publication number
JPH0437390B2
JPH0437390B2 JP6964383A JP6964383A JPH0437390B2 JP H0437390 B2 JPH0437390 B2 JP H0437390B2 JP 6964383 A JP6964383 A JP 6964383A JP 6964383 A JP6964383 A JP 6964383A JP H0437390 B2 JPH0437390 B2 JP H0437390B2
Authority
JP
Japan
Prior art keywords
photoelectrons
predetermined period
photoelectron
counting
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6964383A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59195177A (ja
Inventor
Masayuki Uda
Fumiaki Kirihata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN
Original Assignee
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN filed Critical RIKEN
Priority to JP6964383A priority Critical patent/JPS59195177A/ja
Publication of JPS59195177A publication Critical patent/JPS59195177A/ja
Publication of JPH0437390B2 publication Critical patent/JPH0437390B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP6964383A 1983-04-20 1983-04-20 光電子の計数方法 Granted JPS59195177A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6964383A JPS59195177A (ja) 1983-04-20 1983-04-20 光電子の計数方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6964383A JPS59195177A (ja) 1983-04-20 1983-04-20 光電子の計数方法

Publications (2)

Publication Number Publication Date
JPS59195177A JPS59195177A (ja) 1984-11-06
JPH0437390B2 true JPH0437390B2 (en]) 1992-06-19

Family

ID=13408735

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6964383A Granted JPS59195177A (ja) 1983-04-20 1983-04-20 光電子の計数方法

Country Status (1)

Country Link
JP (1) JPS59195177A (en])

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0616103B2 (ja) * 1985-04-15 1994-03-02 理化学研究所 低速電子測定装置
JPH065287B2 (ja) * 1985-04-15 1994-01-19 理化学研究所 低速電子測定装置
JPH0678999B2 (ja) * 1986-06-30 1994-10-05 理化学研究所 電子計数装置
JPH0542377Y2 (en]) * 1986-11-25 1993-10-26
JP2509886B2 (ja) * 1987-11-24 1996-06-26 理研計器株式会社 光電子放出閾値測定装置

Also Published As

Publication number Publication date
JPS59195177A (ja) 1984-11-06

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